詳細介紹
英國易高Elcometer456探頭
為滿足客戶的特定應(yīng)用要求,所有的英國易高Elcometer456探頭*可互換,且提供大量的設(shè)計與刻度范圍。
- 平直探頭 – 可在平面和曲面上測量涂層
- 微型探頭 - 是測量邊緣涂層、窄管涂層或小型表面區(qū)域涂層的理想產(chǎn)品
- 直角探頭 – 用于測量難以接近的地方
- PINIP™探頭 – 插入式探頭,可把分體式儀器轉(zhuǎn)化為整體式儀器
- 遠端探頭 – 可延伸直角探頭到達一般探頭難以到達的地方
- 超聲/掃描探頭 - 這些探頭均裝有可更換式探頭蓋-用戶可獲取單個讀數(shù)或掃描大塊表面區(qū)域,而不會損壞探頭
- 防水探頭– 封閉設(shè)計,深水中使用,即使佩戴潛水手套也不影響使用
- 高溫探頭 – 可用在溫度高達250℃(480℉)的涂層上
- 陽極氧化探頭 – 抗化學(xué)溶劑腐蝕,非常適合用在陽極氧化環(huán)境中
- 鎧裝探頭 – 探頭帶有重型金屬強化電纜,可降低電纜損壞風(fēng)險
- 軟涂層探頭 – 大塊面積表面探頭,用于檢測軟性覆蓋材料(經(jīng)HVCA認證)
- 專業(yè)探頭 - 這些探頭可用在專業(yè)基體上測量,如:石墨或電鍍組件
鐵基探頭測量鐵磁基體上的非磁性涂層厚度。 Elcometer 456鐵基類儀器認可任何鐵基探頭。 非鐵基探頭測量非鐵基金屬基體上的非導(dǎo)電涂層厚度,Elcometer 456非鐵基類儀器認可任何非鐵基探頭。 兩用FNF探頭可同時用于鐵基和非鐵基應(yīng)用,具有自動識別基體功能。 Elcometer 456 FNF類儀器認可所有鐵基、非鐵基以及兩用FNF探頭。
除非另有說明,需在低達150°C(300°F)的環(huán)境中使用,PINIP探頭需在80°C(176°F)的環(huán)境下使用。
所有均帶有檢測證書以及一套適用于該探頭刻度范圍的校準膜片。
各種涂層/基體的相應(yīng)探頭選擇
附件
| 測量范圍: | 0-1500μm (0-60mils) | 精確度*: | ±1-3% or ±2.5μm (±0.1mil) |
分辨率: | 0.1μm: 0-100μm; 1μm: 100-1500μm (0.01mil: 0-5mils; 0.1mil: 5-60mils) |
探頭設(shè)計 |
| 凸面直徑 | 凹面半徑 | zui小凈空高度 | zui小樣本半徑? | |
直探頭 | 鐵基 F | T456CF1S | 4mm (0.16") | 25mm (0.98") | 85mm (3.35") | 4mm (0.16") |
非鐵基 N | T456CN1S | 10mm (0.39") | 10mm (0.39") | 85mm (3.35") | 4mm (0.16") | |
兩用型 FNF | T456CFNF1S | F Mode: 4mm (0.16") N Mode: 26mm (1.02") | 12.5mm (0.49") | 88mm (3.46") | F Mode: 4mm (0.16") N Mode: 6mm (0.24") | |
直角探頭 | 鐵基 F | T456CF1R | 4mm (0.16") | 25mm (0.98") | 28mm (1.10") | 4mm (0.16") |
非鐵基 N | T456CN1R | 10mm (0.39") | 14mm (0.55") | 28mm (1.10") | 4mm (0.16") | |
兩用型 FNF | T456CFNF1R | F Mode: 4mm (0.16") N Mode: 26mm (1.02") | 12.5mm (0.49") | 38mm (1.50") | F Mode: 4mm (0.16") N Mode: 6mm (0.24") | |
微型M5-90度探頭 | 鐵基 F | T456CFM5R90A | 3mm (0.12") | 6.5mm (0.26") | Headroom: 16mm (0.63") Width: 7mm (0.28") | 4mm (0.16") |
陽極氧化型 | 非鐵基 N | T456CN1AS | 10mm (1.38") | 14mm (0.55") | 100mm (3.94") | 4mm (0.16") |
PINIP探頭 | 鐵基 F | T456CF1P | 4mm (0.16") | 60mm (2.36") | 170mm (6.69") | 4mm (0.16") |
非鐵基 N | T456CN1P | 10mm (0.39") | 50mm (1.97") | 180mm (7.09") | 4mm (0.16") | |
兩用型 FNF | T456CFNF1P | F Mode: 4mm (0.16") N Mode: 26mm (1.02") | 65mm (2.56") | 180mm (7.09") | F Mode: 4mm (0.16") N Mode: 6mm (0.24") |
| 測量范圍: | 0-5mm (0-200mils) | 精確度*: | ±1-3% or ±20μm (±1.0mil) |
分辨率: | 1μm: 0-1mm; 10μm: 1-5mm (0.1mil: 0-50mils; 1mil: 50-200mils) | |||
| 在稀薄涂層上須具有更高的分辨率和準確性,量程2鐵基探頭性能可轉(zhuǎn)化為量程1性能 |
探頭設(shè)計 |
| 凸面直徑 | 凹面半徑 | zui小凈空高度 | zui小樣本半徑? | |
直探頭 | 鐵基 F | T456CF2S | 4mm (0.16") | 25mm (0.98") | 89mm (3.50") | 8mm (0.32") |
非鐵基 N | T456CN2S | 100mm (3.97") | 150mm (5.90") | 88mm (3.46") | 14mm (0.55") | |
直角探頭 | 鐵基 F | T456CF2R | 4mm (0.16") | 25mm (0.98") | 32mm (1.26") | 8mm (0.32") |
鎧裝探頭 | 鐵基 F | T456CF2ARM | 4mm (0.16") | 25mm (0.98") | 138mm (5.43") | 8mm (0.32") |
可伸縮探頭 | 鐵基 F | T456CF2T | 4mm (0.16") | 25mm (0.98") | 36mm (1.42") | 8mm (0.32") |
軟涂層探頭 | 鐵基 F | T456CF2B | Flat Surface | Flat Surface | 89mm (3.50") | 8mm (0.32") |
防水探頭 | 鐵基 F | T456CF2SW-15 | 4mm (0.16") | 40mm (1.98") | 130mm (5.12") | 8mm (0.32") |
PINIP探頭 | 鐵基 F | T456CF2P | 4mm (0.16") | 60mm (2.36") | 174mm (6.85") | 8mm (0.32") |
非鐵基 N | T456CN2P | 100mm (3.97") | 150mm (5.90") | 185mm (7.28") | 14mm (0.55") | |
高溫探頭 250°C (480°F) | 鐵基 F | T456CF2PHT | 4mm (0.16") | 60mm (2.36") | 174mm (6.85") | 8mm (0.32") |
| 測量范圍: | 0-13mm (0-500mils) | 精確度*: | ±1-3% or ±50μm (±2.0mils) |
分辨率: | 1μm: 0-2mm; 10μm: 2-13mm (0.1mil: 0-100mils; 1mil: 100-500mils) |
探頭設(shè)計 |
| 凸面直徑 | 凹面半徑 | zui小凈空高度 | zui小樣本半徑? | |
直探頭 | 鐵基 F | T456CF3S | 15mm (0.59") | 40mm (1.57") | 102mm (4.02") | 14mm (0.55") |
PINIP探頭 | 鐵基 F | T456CF3P | 15mm (0.59") | 45mm (1.77") | 184mm (7.24") | 14mm (0.55") |
| 測量范圍: | F: 0-25mm (0-980mils) | 精確度*: | ±1-3% or ±100μm (±4.0mils) |
N: 0-30mm (1200mils) | ||||
分辨率: | 10μm: 0-2mm; 100μm: 2-30mm (1mil: 0-100mils; 10mils: 100-1200mils) |
探頭設(shè)計 |
| 凸面直徑 | 凹面半徑 | zui小凈空高度 | zui小樣本半徑? | |
直探頭 | 鐵基 F | T456CF6S | 35mm (1.40") | 170mm (6.70") | 150mm (5.90") | 51 x 51mm2 (2 x 2 sq. inch) |
非鐵基 N | T456CN6S | Flat Surface | Flat Surface | 160mm (6.30") | 58mm (2.30") | |
鎧裝探頭 | 鐵基 F | T456CF6ARM | 35mm (1.40") | 170mm (6.70") | 190mm (7.48") | 51 x 51mm2 (2 x 2 sq. inch) |
非 | T456CN6ARM | Flat Surface | Flat Surface | 200mm (7.87") | 58mm (2.30") |
| 測量范圍: | 0-500μm (0-20mils) | 精確度*: | ±1-3% or ±2.5μm (±0.1mil) |
分辨率: | 0.1μm: 0-100μm; 1μm: 100-500μm (0.01mil: 0-5mils; 0.1mil: 5-20mils) |
探頭設(shè)計 |
| 凸面直徑 | 凹面半徑 | zui小凈空高度 | zui小樣本半徑? | |
微型M3探頭 45mm (1.77") | 鐵基 F | T456CFM3---A | 1.9mm (0.07") | 6.5mm (0.26") | 6mm (0.24") | 3mm (0.12") |
非鐵基 N | T456CNM3---A | 6mm (0.24") | 8.5mm (0.33") | 6mm (0.24") | 4mm (0.16") | |
微型M3-90度探頭 45mm (1.77") | 鐵基 F | T456CFM3R90A | 1.9mm (0.07") | 6.5mm (0.26") | Headroom: 16mm (0.63") Width: 7mm (0.28") | 3mm (0.12") |
非鐵基 N | T456CNM3R90A | 6mm (0.24") | 8.5mm (0.33") | Headroom: 16mm (0.63") Width: 7mm (0.28") | 4mm (0.16")
| |
微型M3-45度探頭 45mm (1.77") | 鐵基 F | T456CFM3R45A | 1.9mm (0.07") | 6.5mm (0.26") | Headroom: 18mm (0.71") Width: 7mm (0.28") | 3mm (0.12") |
微型M3-90度角 150mm (5.90") | 鐵基 F | T456CFM3R90C | 1.9mm (0.07") | 6.5mm (0.26") | Headroom: 16mm (0.63") Width: 7mm (0.28") | 3mm (0.12") |
非鐵基 N | T456CNM3R90C | 6mm (0.24") | 8.5mm (0.33") | Headroom: 16mm (0.63") Width: 7mm (0.28") | 4mm (0.16") |
刻度0.5石墨 | 范圍 | 0-500μm (0-20mils) | 精確度* | ±1-3%或±2.5μm(±0.1mil) |
分辨率 | 0.1μm: 0-100μm;1μm: 100-500μm(0.01mil: 0-5mils;0.1mil: 5-20mils) |
探頭樣式 |
|
凸面直徑 |
凹面半徑 |
zui小凈空高度 |
zui小樣本半徑 | |
zui小90°石墨 45mm (1.77") | 非鐵基 N | T456CNMG3R90A | 6mm (0.24") | 8.5mm (0.33") | Headroom: 16mm (0.63") | 4mm (0.16") |
zui小90°石墨 150mm (5.90") | 非鐵基 N | T456CNMG3R90C | 6mm (0.24") | 8.5mm (0.33") | Headroom: 16mm (0.63") | 4mm (0.16") |
zui小90°石墨 | 非鐵基 N | T456CNMG3R90E | 6mm (0.24") | 8.5mm (0.33") | Headroom: 16mm (0.63") | 4mm (0.16") |
超聲/掃描探頭 | 范圍: 0-1500μm (0-60mils)+ |
精確度*^: ±1-3% or ±2.5μm (±0.1mil) | |||||
分辨率: 1μm: 0-1500μm (0-60mils) |
探頭樣式 | zui小凈空高度 | zui小樣本半徑? | ||
超聲/掃描探頭 | 鐵基F | T456CF1U | 85mm (3.50") | 5mm (0.59") |
兩用型 FNF | T456CFNF1U | 85mm (3.50") | 5mm (0.59") | |
產(chǎn)品信息 |
| T456C23956 | 超聲/掃描探頭備用保護蓋(3/包)# |
取較大者
FNF(F): FNF探頭的F模式; FNF(N):FNF探頭的N模式
使用無涂層基體樣本進行校準
在光滑表面檢測時,在50多公里(30英里)外掃描探頭保護蓋
不帶探頭保護蓋